CH EN
CH
Assembly EL+ double-sided aspect
Key technical parameters

  • Theory:EL images are obtained by industrial infrared cameras and image algorithms and AI are used to detect photovoltaic modules for defects and defects are automatically classified and labeled.
  • Machine size:2956mm(L)*2500(W)*2500mm(H)
  • Component size:Length 1640~25500mm Width 950~1450mm
  • Cell size:156mm-210mm
  • Work pace:<16s
  • Accuracy:Appearance 0.144mm、EL0.282mm
  • Component transfer mode:Long edge advance of component
  • Sample placement:Flat type component face down
  • Detection type:Single crystal/polycrystalline silicon solar modules Double glass double-sided components compatible with whole and half pieces three pieces of components
  • Image acquisition time:0.1~10s tunableness